Atomic force microscopy (AFM)

The Atomic force microscopy (AFM) is one of the foremost tools for imaging, measuring, and manipulating matter at the nanoscale either in ambient conditions or liquid environment. The AFM can be operated in a number of modes: contact, tapping and non-contact, depending on the application. Three Multimode 8 AFMs (with ScanAsyst and Peak Force QNM mode) and one Dimension FastScan Bio AFM are available in the FSM laboratory.